Joseph Lyding, a of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.
CHAMPAIGN, Ill. A simple new improvement to an essential microscope component could greatly improve imaging for researchers who study the very small, from cells to computer chips. Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique. The technique is described in research published this week . Scanning probe microscopes provide images of tiny structures with high resolution at the atomic scale. The tip of the probe skims the surface of a sample to measure mechanical, electrical or chemical properties. Such microscopes are widely used among researchers who work with tiny structures in fields from nanotechnology to cellular biology.
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