New Invention for more Efficient Atomic Force Microscopes

Tiny tips on cantilevers are used to scan a surface in an atomic force microscope. A new invention from TU Wien now provides a simpler way to measure the result. The basic principle of the atomic force microscope is very simple: an extremely thin, movable tip on a cantilever is moved over a surface that is being examined. Tiny forces on an atomic scale act between the tip and the surface and influence the movement of the cantilever. If the tip's behaviour is measured very precisely, information can be gained about the surface and a high-resolution image of the finest surface details can be created on the computer. To achieve the necessary precision, relatively complex data processing technology is used today. TU Wien (Vienna) has now been able to show: There is a simpler way.